ABSTRACT
Lot of
Integrated Circuits (IC has been developed over the years as the technological revolution
continues to prosper. These IC pass through a lot of processes before getting
to the final consumer, more especially when electronic gadgets needs repair and
maintenance due to real time problems that arise out of nature. The basic
function of the digital IC tester is to test a digital IC for the correct
logical functioning as described in the truth table, before putting it in use.
In
this project report, a digital IC tester is built to test a series of 14 pins
IC belonging to the 74TTL series. These IC’s are the basic logic gates common
in electronics, namely; the AND, OR, EX-OR, NAND, NOR and EX-NOR gates. Our
main aim is to design and implement a model IC tester using an LCD, some series
of LED, a ZIF Socket, some analogue circuits and a microcontroller (AT89C52)
which applies the necessary signals to the inputs of the IC, monitoring the
outputs at each stage and comparing them with the outputs in the truth table.
Any discrepancy in the functioning of the IC results in a fail indication on
the LCD. The testing procedure is accomplished with the help of a series of
logically arranged programming codes hard written into the microcontroller, in
which case there is no need for manually testing the IC with the aid of input
keys. This digital IC tester can find its use in school laboratories, for
experimental purposes. The system’s structure is presented in this paper,
giving in details the functions of each of the components used sand the
subsystem involved also explained is the hardware and software architecture of
some major device.
TABLE
OF CONTENT
TITLE PAGE
CERTIFICATION
DEDICATION
ACKNOWLEDGMENT
TABLE OF CONTENTS
ABSTRACT
CHAPTER
ONE
1.0 Introduction
1.1 Motivation
1.2 Objectives
CHAPTER
TWO
2.0 Literature
review
2.1 IC tester
introduction
2.2 IC tester in
market
2.2.1 SU-300 IC
tester
2.2.2 Digital based
IC tester
2.2.3 Model 570 analogue IC tester and model 575A digital
IC tester
2.3 Syntheses
CHAPTER
THREE
3.0 Design and
Construction
3.1 Design
3.2 The power
supply unit
3.3 The MCU
oscillation input unit
3.3.1 The reset
circuit
3.4 The
microcontroller unit
3.5 Liquid crystal
display
3.6 Interfacing a
16 x 2 LCD module to AT89SI microcontroller
33 Logic gate
3.8 The principles
of operation of the project
3.9 Construction
and packaging
CHAPTER
FOUR
4.0 Recommendation
and conclusion
4.1 Recommendations
4.2 Conclusion
References
Appendix
CHAPTER ONE
1.0 INTRODUCTION
In
any manufacturing industry there are continuous efforts in cost reductions,
upgrade quality and improve overall efficiencies. In electronic industry, with
dramatic increase in circuit complexity and the need for the higher levels of
reliability, a major contributor cost in any product can be in the testing.
However we should recognize in the real world that no product is perfect, so
that testing and in particular automatic testing will be an essential part of
production in the foreseeable future. In industries, research centres and
college, some common IC are frequently used; many times people face problems
due to some fault in these integrated circuits. So it is very essential to test
them before actually using them in any of the applications. Digital IC tester
is best solution for these problems. This project has the capability of testing
digital IC like AND, OR, X-OR, NAND, NOR and EX-NOR gates of 14 pins.
1.1 MOTIVATION
The
IC testers available in the market today are too costly for individuals to own.
Therefore we decided to construct an IC tester which is affordable and
user-friendly. The motivation is to build an affordable IC tester for testing
the function of 74 series TTL Logic Gates and common flip-flop ICs. The test
sequence provide in the database facilitates the detection of defective ICs.
Furthermore, the IC tester must be easy to operate, compact, lightweight,
portable, and low power consumption. Next, the motivation is to provide an IC
tester in portable mode which is easy and convenient to carry around.
1.2 OBJECTIVES
For
this project, the development of a logic IC functional tester will be carried
out. The programmable test system will be designed so that the end user has
total control over testing of ICs. In which ease, the IC tester must allow
users with no programming expertise to generate tests and operate the system
quickly and efficiently. This IC tester can simply be used by the user just
taking the following few steps.
·
Insert the IC into the IC socket.
·
Press pushbutton to test the IC inserted.
·
The microcontroller will perform testing
operation.
·
Result will be displayed on the LCD after
test routine is done.
The
ICs that can be tested on this IC tester are the basic logic gates. The models basic
gates are 74LS00 (NAND), 74LS02 (NOR), 74LS08 (AND), 74L832 (OR), and its
equivalent.
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